Texture Workshop 2015 at HPSTAR (Shanghai)

The 2015 Workshop on “Texture Analysis Using the Rietveld Method from Synchrotron X-ray Diffraction Data” was held at HPSTAR (Shanghai) on May 19th to 20th, 2015. It’s the second international workshop of texture studies since 2012.

At the workshop, the professors from several countries delivered serials of lectures on radial diamond-anvil cell XRD experimental methods and texture data analysis. The all participants received the hands-on training of texture analysis using MAUD (Material Analysis Using Diffraction), which is a general diffraction program mainly based on the rietveld method, but not limited to. The MAUD program together with radial diffraction techniques developed in last two decades greatly helped and advanced the deformation studies in material science and earth science.

“This workshop has promoted the collaborations on rheology research devoted to understanding the fundamental deformation mechanisms of metals, ceramics and minerals at extreme conditions”, remarked Bin Chen, Staff Scientist and Director, Shanghai Laboratory of HPSTAR.

　　Invited Speakers:

　　H-R. Wenk (UC Berkeley, USA);

　　W. Kanitpanyacharoen (Chulalongkorn University, Thailand)

　　Sébastien Merkel (U. Lille 1, France);

　　L. Lutterotti (U. Trento, Italy);

　　L. Miyagi (U. Utah, Salt Lake City, USA).