1)      Probing atomic structure by in-situ high pressure TEM

The in-situ TEM and DAC device facilities provide promising experimental techniques whereby the behavior of defects such as dislocations and twins under high stress loading. We can therefore directly observe and characterize the dynamical process of defect motions, which are crucial for understanding and tuning the materials' properties under stress loading.

In-situ high-pressure TEM; Advanced Materials, 1906105 (2019)

2)      Pressure-tuned electronic structure of MOF and AIE under pressure

Porous metal organic frameworks (MOFs) have been widely applied into gas storage and separation, which required that MOF materials owned high mechanical stability. Newly synthesized metal-doped MOF materials based on multi-carboxylate ligands have been characterized under high pressure (HP) condition using in-situ synchrotron X-ray diffraction, which would provide detailed structural information and help to understand the insight of structure-mechanical property. As a conventional insulator, the band structures of MOF can be tuned by metallic ion doping and then further optimized through high pressure techniques, which paves a new road in the field of electrochemical catalysis.

Ultra-stable MOFs under pressure; Inorganic Chemistry, 61, 15166−15174 (2022)

3)      High-pressure beamline 15U1b @ SSRF

At the 15U1b beamline (dedicated high-pressure XRD, HPSTAR) of SSRF, the synchrotron beam focuses down to ~ 3.2 um @ 20 keV.

 Beamline 15U1b